Achtung:

Sie haben Javascript deaktiviert!
Sie haben versucht eine Funktion zu nutzen, die nur mit Javascript möglich ist. Um sämtliche Funktionalitäten unserer Internetseite zu nutzen, aktivieren Sie bitte Javascript in Ihrem Browser.

Transmission Electron Microscope CM200

Technical Specifications

  • Analytical Transmission Electron Microscope TEM-STEM Philips CM200 with a maximum accelerating voltage: 200 kV
  • Magnification in normal TEM operation: 22x – 1,000,000x; in HR operation with resolution of 0.24 nm
  • Raster scan unit for micro-analysis, bright and dark field STEM-imaging, varying diffraction modes
  • EDX-analysis with an energy-dispersive spectrometer from EDAX, Super UTW Si (Li) detector; Resolution: 125 eV, detection of all elements with atomic number higher than Boron (Z =5)
  • Double-tilt cradle, as well as cooled or heated cradles for examinations from -120° up to 100° C, Tilt angle: 20°
  • Photographic plate camera, as well as video camera with monitor connection

Applications

  • Investigation of nano-scale structures
  • Analysis of deformation mechanisms
  • Imaging of lattice defects such as dislocations, grain boundaries, or precipitates
  • Detection of phase transformations
Further information:
Contact

Kristina Duschik

Werkstoffkunde

Kristina Duschik
Phone:
+49 5251 60-3019
Fax:
+49 5251 60-3854
Office:
E5.127

The University for the Information Society