Confocal Laser Scanning Microscope LEXT OLS3100
The Confocal Laser Scanning Microscope Olympus LEXT OLS3100 offers the possibility of conducting high-resolution topography appraisal, particle analysis, and layer thickness or surface roughness measurements.
Technical Specifications:
- Magnification 5x to 100x, additional 6x optical zoom function
- Maximum distance from specimen (50 x long-range objective lens)
- Axial resolution: max. 10 nm
- Lateral resolution: max. 120 nm
- Max. angle 70°, undercuts and overhangs not displayable
Applications:
- Surface analysis
- Topography measurements
- Surface roughness measurement
- Particle analysis